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微型光谱仪中传感器S11639的非线性校正

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文章导航 > 光电工程 > 2017 Vol. 44 > No. 11 > 1101-1106

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童建平, 高建勋, 汪飞, 等. 微型光谱仪中传感器S11639的非线性校正[J]. 光电工程, 2017, 44(11): 1101-1106. doi: 10.3969/j.issn.1003-501X.2017.11.010
引用本文: 童建平, 高建勋, 汪飞, 等. 微型光谱仪中传感器S11639的非线性校正[J]. 光电工程, 2017, 44(11): 1101-1106. doi: 10.3969/j.issn.1003-501X.2017.11.010
shu
Jianping Tong, Jianxun Gao, Fei Wang, et al. Nonlinear correction of the sensor S11639 in mini-spectrometer[J]. Opto-Electronic Engineering, 2017, 44(11): 1101-1106. doi: 10.3969/j.issn.1003-501X.2017.11.010
Citation: Jianping Tong, Jianxun Gao, Fei Wang, et al. Nonlinear correction of the sensor S11639 in mini-spectrometer[J]. Opto-Electronic Engineering, 2017, 44(11): 1101-1106. doi: 10.3969/j.issn.1003-501X.2017.11.010
shu

微型光谱仪中传感器S11639的非线性校正

    • 1.

      浙江工业大学理学院，杭州 310023

    • 2.

      杭州博源光电科技有限公司，杭州 311400

  • 基金项目:
    国家自然科学青年基金资助项目(11605153)
详细信息

Nonlinear correction of the sensor S11639 in mini-spectrometer

    • 1.

      College of Science, Zhejiang University of Technology, Hangzhou 310023, China

    • 2.

      Hangzhou Brolight Technology Co. Ltd., Hangzhou 311400, China

  • Fund Project:
More Information
    摘要

  • S11639线阵传感器常被用于需要紫外测量的微型光谱仪中。但当S11639曝光量较大时，会出现光谱响应的非线性，从而影响微型光谱仪的动态范围，因此必须进行非线性校正。利用卤钨灯与氘灯测量微型光谱仪的光电响应特性曲线，找出S11639的曝光量与A/D转换输出的线性部分，对数据进行直线拟合，获得S11639在线性范围内的系数。在此基础上，外推得到其在非线性范围内的理论值，求出理论值与实际测量值的差异，利用最小二乘法进行多项式拟合，实现S11639线阵传感器的非线性校正。同时，对比实验结果，分析实验数据的误差成因，为更好地利用基于S11639微型光谱仪的全动态范围光电检测提供实验依据。

    Linear array sensor S11639 is often used in mini-spectrometer for UV measurement. However, when the exposure volume of S11639 is relatively bigger, the non-linearity of the spectral response will appear. This nonlinear effect will affect the dynamic range of the mini-spectrometer, and therefore, nonlinear correction must be carried out. Photoelectric response of S11639 is measured with halogen tungsten lamp and deuterium lamp to find out the linear part between the exposure and the A/D conversion output, and straight line fitting of the data is made to obtain the factors of S11639 in the linear range. Based on it, the theoretical value in nonlinear range is got by extrapolation, and the difference between the theoretical value and the actual measurement value was calculated. The nonlinear correction of S11639 is realized by polynomial fitting with the least square method. At the same time, compared with the experimental results, the error causes of the experimental data are analyzed, and the experiment is provided for better utilization of mini-spectrometer based on S11639 for photoelectric detection in the full dynamic range.

    • Overview

  • Abstract: S11639 is often used in mini-spectrometer for UV measurement. Ideally, each pixel of S11639, in the whole dynamic range, has good linearity between the amount of incident light and signal charge produced by photoelectric conversion. However, when the exposure of S11639 is bigger, the nonlinearity of S11639 photoelectric response will appear. The nonlinearity of S11639 is related to its structure, because sharing and diffusion of the pixel potential wells occur in the photosensitive area, and the charge interaction enhances more with the increase of the exposure, and even leads to charge overflow. So the more the exposure, the worse the linearity of S11639. The nonlinearity of the S11639 photoelectric response affects the dynamic range of the spectrometer. S11639 is applied in mini-spectrometer which has its own light dispersion system. Halogen tungsten lamp and deuterium lamp are compensated to light from the ultraviolet to the near infrared range of 215 nm~2500 nm. The light is injected through the optical fiber to spectrometer with this light source. The composite light passing asymmetric C-T optical system is decomposed into monochromatic light which is shined on the surface of S11639. The signal is amplified linearly and converted by A/D converter, and the output of A/D conversion is a function of the exposure. Photoelectric response of S11639 is measured to find out the relations between the exposure and the A/D conversion output in the multi wavelength positions of S11639. The conclusion is described below: If the A/D initial output values are the same in different wavelength positions by adjusting the light intensity, the integral time is changed at the same step, and the changes of A/D output value are still the same, so only a photoelectric response curve is measured at one wavelength position, which is suitable for other wavelengths. By changing the integration time of the spectrometer at one wavelength position, the exposure of S11639 is changed, and the value of the A/D conversion is obtained. Straight line fitting of the data is made to obtain the factors of S11639 in the linear range of one wavelength position. Extrapolating from the linear part will reach the theoretical values in nonlinear range, and we can calculate the differences between the actual measurement values and the theoretical values. The polynomial fitting with least squares method realizes the nonlinear correction of S11639 at one wavelength position. Since the coefficients of the linear fitting are the same at different wavelengths, they can be applied to nonlinear correction at other wavelengths. At the same time, compared with the experimental results, the error causes of the experimental data are analyzed, and the experiment is provided for better utilization of mini-spectrometer based on S11639 for photoelectric detection in the full dynamic range.

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  • 图 1  不同积分时间的光谱响应.

    Figure 1.  Spectral response in different integration time.

    下载: 全尺寸图片 幻灯片

    图 2  测试示意图.

    Figure 2.  Schematic of test.

    下载: 全尺寸图片 幻灯片

    图 3  S11639的积分时间与A/D转换值关系图.

    Figure 3.  A/D converter data vs. integral time of S11639.

    下载: 全尺寸图片 幻灯片

    表 1  S11639的A/D转换值.

    Table 1.  A/D converter data of S11639.

    积分时间t/ms波长/nm
    256.690263.551759.842807.5
    0.5850878855858
    5.01473149214661478
    10.02157221021382162
    20.03525353035413552
    30.04852487149064881
    40.06250628862486283
    50.07521764875437587
    100.014100142731435814440
    200.027169274322759727787
    300.040107404974103040987
    350.046158466484761647323
    400.051600516665162051111
    450.056167566055659556312
    500.062618631596259762819
    下载: 导出CSV

    表 2  759.842 nm处A/D的理论值与实际差值.

    Table 2.  A/D differences between theoretical value and actual value at 759.842 nm.

    积分时间t/ms理论值实际值两者差百分误差/%
    0.5920855657.09
    5.015221466563.70
    10.021912138532.43
    20.035293541-11-0.33
    30.048674906-38-0.79
    40.062056248-42-0.68
    50.07543754300.00
    100.01423314358-124-0.88
    200.02761327597160.06
    300.04099341030-360.09
    350.04768347616670.14
    400.0543735162027535.06
    450.0610635659544687.32
    500.0677536259751567.61
    下载: 导出CSV

    表 3  256.690 nm处A/D的理论值与实际差值.

    Table 3.  A/D differences between theoretical value and actual value at 256.690 nm.

    积分时间t/ms理论值实际值修正程度值修正后的值百分误差/%
    0.510098503853-15.47
    5.015941473471520-4.63
    10.022442157732230-0.63
    20.0354435257235971.47
    30.0484548522848800.72
    40.061466250-3762121.08
    50.074477521-987423-0.32
    100.01395014100-17313927-0.16
    200.02695627169151273201.35
    300.03996240107-43439673-0.72
    350.04646546158333464910.06
    400.052968516002265538651.69
    450.059471561674378605451.80
    500.065974626185147677652.72
    下载: 导出CSV
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收稿日期:  2017-08-10
修回日期:  2017-10-10
刊出日期:  2017-11-15

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