用于原位监测纳米薄膜特性的全光纤椭偏仪

光电工程

用于原位监测纳米薄膜特性的全光纤椭偏仪

文章导航 > 光电工程 > 2025 Vol. 52 > No. 2 > 251002

用于原位监测纳米薄膜特性的全光纤椭偏仪[J]. 光电工程, 2025, 52(2): 251002. doi: 10.12086/oee.2025.251002.h01

引用本文:

用于原位监测纳米薄膜特性的全光纤椭偏仪[J]. 光电工程, 2025, 52(2): 251002. doi: 10.12086/oee.2025.251002.h01

All-fiber ellipsometer for nanoscale dielectric coatings[J]. Opto-Electronic Engineering, 2025, 52(2): 251002. doi: 10.12086/oee.2025.251002.h01

Citation:

All-fiber ellipsometer for nanoscale dielectric coatings[J]. Opto-Electronic Engineering, 2025, 52(2): 251002. doi: 10.12086/oee.2025.251002.h01

刊出日期: 2025-02-28

All-fiber ellipsometer for nanoscale dielectric coatings

Published Date 28 February 2025

点击扫一扫

用微信扫码二维码

分享至好友和朋友圈